产品详情
QE(大小光斑)量子效率测量,反射率测量,透射率测量
QE(大小光斑)量子效率测量,反射率测量,透射率测量
Brand: Vision
Model: PVE300-IVT300
产品详情

QE(大小光斑)量子效率测量,反射率测量,透射率测量;

Spectral Response, QE,IPCE system



基本功能和用途

▪ 测量电池或小组件超小面积内的光谱响应和内外量子效率(如栅线之间,焊带上)  

▪ 测量电池或小模组超大面积:210mm x 210mmg电池的总体光谱响应;  

▪ 以一级或者二级的参考标片为溯源体,测量电池的绝对光谱响应,定标出电池片在AM1.5G光谱及标准测试条件下的短路电流密度Jsc;  

▪ 定量地分析电池片Isc各项耗损,系统性地监控和改善电池生产工艺;  

▪ 测量电池片或组件各波段的光谱响应、不同硅片效率差异对比分析,背抛光工艺调试,黑硅工艺调试,以及电池与组件材料光谱匹配度分析;  

▪ 测量组件封装材料:玻璃/EVA/背板的反射率和透射率;测量组件封装材料:玻璃-EVA-电池-背板“封装的陷光特性”;

▪ 电池到组件 (CTM)损益 分析方法和软件,定量地分析电池片封装成组件过程的耗损和增益,系统性地监控和改善组件生产工艺;



设备制造商:

英国Bentham Instrument (UK) 和新加坡维信科技有限公司(IVT)联合开发


Overview

The PVE300 system is a monolithic, turnkey solution forphotovoltaic device research in industry and academia, permitting the quick andaccurate characterisation of photovoltaic devices and materials.

Backed by Bentham’s extensive experience in thefield of light measurement, this system can be configured to cover the spectralrange and device type of your choice.

Features

Absolute spectral Responsively, External QuantumEfficiency measurement; Incident Photon to Charge Carrier Efficiency (IPCE)measurement; Integrating sphere-based determination of reflectance/transmittance to yield internal quantum efficiency (IQE, %)

All Type of Solar Cell, Silicon, Ge, CdTe, CIS,Organic, Dye-sensitized; Single or Multi-junction devices (with Bias lightoption); Spectral range 300 --- 1100nm; Optional Extension to 1800nm Testingunder variable bias light, Bias light intensity up to one sun illumination



美国:+1 (408) 420-3561    |   北京:+86 (010) 62561331    |   上海:+86 (021) 61363596


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